UnivIS
Informationssystem der Friedrich-Alexander-Universität Erlangen-Nürnberg © Config eG 
FAU Logo
  Sammlung/Stundenplan    Modulbelegung Home  |  Rechtliches  |  Kontakt  |  Hilfe    
Suche:      Semester:   
 
 Darstellung
 
Druckansicht

 
 
Modulbeschreibung (PDF)

 
 
 Außerdem im UnivIS
 
Vorlesungs- und Modulverzeichnis nach Studiengängen

Vorlesungsverzeichnis

 
 
Veranstaltungskalender

Stellenangebote

Möbel-/Rechnerbörse

 
 
Maschinenbau (Master of Science) >>

Optical Manufacturing Metrology (OMM)5 ECTS
(Prüfungsordnungsmodul: International Elective Modules)

Modulverantwortliche/r: Tino Hausotte
Lehrende: Tino Hausotte


Startsemester: SS 2014Dauer: 1 SemesterTurnus: jährlich (SS)
Präsenzzeit: 60 Std.Eigenstudium: 90 Std.Sprache: Englisch

Lehrveranstaltungen:


Inhalt:

  • Introduction: manufacturing metrology and main task: fields of industrial metrology, main tasks (control the conformity, readjusting/correcting of process parameters), objectives and aims (ensure the function, interchangeability, correction parameters for manufacturing processes) • measuring, testing, monitoring • equipment in manufacturing metrology • optics (theories: quantum, wave, ray), effects, properties and principles of measurement
  • Geometrical tolerances: basic (GPS) Framework, duality principle and operations (partition, extraction, filtration, association, collection, construction) • definitions of geometric elements, standard geometrical elements • geometrical parameters of workpieces, classification system for form deviations • linear and angular dimensions (terms and definitions) • ISO-system for tolerances of linear sizes (terms and definitions, types of fits, code system) • symbols and drawing indication of geometrical tolerances • definition of form tolerances • datums • orientation, location and run-out tolerances • several essential specifications for GPS (CT, E, M, F) • surface texture parameters (determination, types)

  • Measurement and Evaluation Strategies: determination of measurement strategy, probing strategy and evaluation strategy (Minimum and recommended number of probing points, Nyquist‘s Criterion, probing of feature segments, evaluation criteria) • influences on the uncertainty of measurement results (uncertainty of measurement, Golden Rule)

  • Optical Principles and Components: Theories of optics • Geometrical optics (reflection, refraction, fibre optic components, ray tracing, lenses, aberration, beam splitter, mirrors, prisms, reflectors) • Wave optics (wave equations, polarisation, polarisers, beam-splitting polarisers, coherence and interference, diffraction ) • Quantum optics (spontaneous emission, light-emitting-diodes and detectors, stimulated emission, laser, photoelectric effect and detectors)

  • Tolerances of optical Components: reference wavelengths • testing areas and volumes • dimensioning of lenses and of edges, dimension and protective chamfers • specification of angle • material specification (stress birefringence, bubbles and other inclusions, inhomogeneities and striae) • surface treatment and coating

  • Scales and Encoders: Abbe comparator principal (traceability, 1th order and 2nd order error, Abbe comparator) • linear encoder (principle, Moiré-effect and reticle, detection of motion direction) • output signals and demodulation of encoder signals (counting and resolution enhancement) • reading head of encoders (imaging and interferential measuring principle, transmitted and reflected light) • reference marks • absolute encoders (U- and V-scanning and Gray code)

  • Interferometer for length measurements: interference and interferometer • Michelson-Interferometer • superposition of waves, Basics of the interference, Interference of light waves • homodyne and heterodyne principal • interference at a Michelson-Interferometer • interference of a homodyne interferometer • demodulation at a homodyne interferometer (dead path) • demodulation at a heterodyne Interferometer • refractive index of air (dependency, measurement) • coherence (spatial and temporal, interferograms with two monochromatic light, white light) • He-Ne-Laser (modes and mode distances, stability) • interferometer setups and adjustment

  • Interferometer for surface measurements: interference of equal inclination • interference of equal thickness • multiple beam interference • demodulation with phase shifting (principle, generation of phase shift, unwrapping) • application of Fizeau Interferometry • interference microscopes (setups, evaluation)

  • Optical Surface Measurements: microscope designs, measuring microscope • numerical aperture and resolution • focus variation • confocal microscope (principle, setups, laser-scanning microscope) • chromatic white-light sensor • laser autofocus method (characteristic curve, principles with astigmatic lens and Foucault knife) • summary: optical probing

Lernziele und Kompetenzen:

  • Motivation for manufacturing metrology
  • Objectives, tasks and quantities in manufacturing metrology

  • Inspection equipment in manufacturing metrology

  • GPS concept and tolerances

  • Optical metrological methods

  • Optical measurement procedures and it’s applications

Literatur:

  • Yoshizawa, T.: Handbook of optical Metrology: Principles and Applications. Boca Raton, CRC Press, 2009
  • Gåsvik, K. J.: Optical metrology. New York, Wiley, 2002

  • Benteley, J. P.: Principles of Measurement Systems. Essex, Prentice Hall, 1995

  • International Vocabulary of Metrology – Basic and General Concepts and Associated Terms, VIM, 3rd edition, JCGM 200:2008

Organisatorisches:

  • Vortragssprache: Englisch
  • Unterlagen zur Lehrveranstaltung werden auf der Lernplattform StudOn (www.studon.uni-erlangen.de) bereitgestellt. Das Passwort wird in der ersten Vorlesung bekannt gegeben.


Weitere Informationen:

Schlüsselwörter: FMT
www: http://www.fmt.tf.fau.de/lehre/lehrveranstaltungen.php

Verwendbarkeit des Moduls / Einpassung in den Musterstudienplan:

  1. Maschinenbau (Master of Science): 2. Semester
    (Po-Vers. 2013 | Studienrichtung International Production Engineering and Management | Masterprüfung | International Elective Modules)
Dieses Modul ist daneben auch in den Studienfächern "International Production Engineering and Management (Bachelor of Science)" verwendbar. Details

Studien-/Prüfungsleistungen:

Optical Manufacturing Metrology (Prüfungsnummer: 49003)
Prüfungsleistung, Klausur, Dauer (in Minuten): 90, benotet
Anteil an der Berechnung der Modulnote: 100.0 %
weitere Erläuterungen:
Prüfungstermine, eine allgemeine Regel der Prüfungstagvergabe und Termine der Klausureinsicht finden Sie auf StudOn: Prüfungstermine und Termine der Klausureinsicht

Erstablegung: SS 2014, 1. Wdh.: WS 2014/2015, 2. Wdh.: keine Wiederholung
1. Prüfer: Tino Hausotte

UnivIS ist ein Produkt der Config eG, Buckenhof