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Einrichtungen >> Technische Fakultät (TF) >> Department Informatik (INF) >> Lehrstuhl für Informatik 7 (Rechnernetze und Kommunikationssysteme) >>
MaTeLo (Markov Test Logic)

In the MaTeLo project the Design and Test of Communication Systems (DeTeCos) team was responsible to generate MCML descriptions from a given set of usage scenarios. This approach allows the automatic generation of a MCUM (Markov chain usage model) without a deeper knowledge of the human tester with respect to the Markov theory. In order to be independent of the chosen scenario specification technique, i.e. either MSC-96 or UML sequence diagrams, it was useful to define a common XML-based representation and tool interchange format for the MCUM, called MCML (Markov Chain Markup Language). This format represents a common interface between various tools of the MaTeLo approach. All steps in this transformation process do also support the testing of QoS (Quality of Service) requirements that are annoted in the standard notation of the UML profile for "Scheduling, Performance and Time".
The transformation algorithms are implemented within the MaTeLo tool and create generic interfaces to existing modeling and development tools like Rational Rose and Telelogic TAU.
Dr.-Ing. Winfried Dulz

Fenhua Zhen, M. Sc.

model-based testing; Markov chain usage model; Markov chain markup language; UML sequence diagrams; MSC; TTCN-3

Laufzeit: 1.1.2002 - 30.9.2004

Europäische Kommission

Mitwirkende Institutionen:
Lehrstuhl für Informatik 7
Lund Universität (S)
Alitec (F)
Danet (D)
Magneti Marelli (F)
NEC France (F)
Alenia Spazio (I)

Dulz, Winfried
Dulz, Winfried: MaTeLo - Statistical Testing Using Annotated Sequence Diagrams, Markov Chains and TTCN-3. Erlangen : Friedrich-Alexander-Universität Erlangen-Nürnberg. 2002 (05). - Interner Bericht
Beyer, Matthias ; Dulz, Winfried ; Zhen, Fenhua: Automated TTCN-3 Test Case Generation by means of UML Sequence Diagrams and Markov. In: unbekannt (Hrsg.) : IEEE Proc. of 12th Asian Test Symposium (IEEE 12th Asian Test Symposium Xi'an, China 16-19 November 2003). 2003, S. 102-105.
Dulz, Winfried ; Zhen, Fenhua: MaTeLo - Statistical Usage Testing by Annotated Sequence Diagrams, Markov Chains and TTCN-3. In: nicht bekannt (Hrsg.) : IEEE Proc. of Third International Conference on Quality Software (QSIC 2003) (IEEE Third International Conference on Quality Software (QSIC 2003) Dallas, Texas 6.-7. November 2003). 2003, S. 336-342.
Dulz, Winfried: Recent Experiences with Scenario-based Statistical Testing.Vortrag: Dagstuhl-Seminar 04371 "Perspectives of Model-Based Testing", Schloss Dagstuhl, 5.-10. September.2004
Dulz, Winfried: Scenario-based Statistical Testing.Vortrag: VVSS2004-Symposium "Verification and Validation of Software Systems", LaQuSo Laboratory for Quality Software, TU Eindhoven, 24. November.2004
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