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	Basics in Computational Materials Science and Process Simulation 2 [B_Compu_2] VORL; 2 SWS; ben. Schein; ECTS: 3; Fr, 10:30 - 12:00, 1.225; Einzeltermin am 23.5.2008, 13:00 - 15:00, 1.225	PF MAP-S-BMP 2 PF MAP-S-NM 2 PF MAP-S-CMP 2 PF MAP-S-AP 2	Arlt, W.
	Chemical Analysis and Structure Determination [AnStruc] VORL; 2 SWS; ben. Schein; ECTS: 3; Di, 14:15 - 15:45, 1.225; Einzeltermin am 20.5.2008, 10:00 - 12:00, 1.225	PF MAP-S-BMP 2 PF MAP-S-NM 2 PF MAP-S-CMP 2 PF MAP-S-AP 2	Wasserscheid, P. Arlt, W. Peukert, W.
	Nanoscale Surface Characterization and Structures [SurfChar] VORL; 2 SWS; ECTS: 3; Mo, 15:15 - 16:45, 1.225	PF MAP-S-BMP 2 PF MAP-S-NM 2 PF MAP-S-CMP 2 PF MAP-S-AP 2	Kunze, J. Schmuki, P.

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