Schwerpunktfächer
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Advanced Semiconductor Technologies - Processing (including Lab Work Organic Electronics Processing) [AST-Processing]
V/UE; Online/Präsenz; 2 SWS; Schein; ECTS: 3; Gaststudierende; VL (2 ECTS) includes Lab Work "Processing of device components with roll-to-roll compatible coating methods " (1 ECTS) or the Seminar "Special topics in printed electronics" (1 ECTS), Vorbesprechung im Rahmen Vorbesprechung i-MEET am 25.4.22 um 17 Uhr, https://fau.zoom.us/j/68977984918?pwd=L0dmVkNOU3c5ZHdWT2w1cTlIYWdidz09; Mi, 10:15 - 11:45, 1.225; ab 4.5.2022; Raum 1.225, LS für Biomaterialien, Cauerstr. 6, 91058 Erlangen
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WF MWT-MA ab 2
WF NT-MA ab 2
WF ET-MA ab 2
WPF MAP-S-AP ab 2
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Egelhaaf, H.-J.
Brabec, Ch.J.
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Biomaterials for Tissue Engineering [BioMTE]
VORL; Präsenz; 2 SWS; ECTS: 3; war: "Biomaterials for Tissue Scaffolds"; Prüfungssprache: Deutsch (außer MAP).; Di, 14:15 - 15:45, 1.84
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WPF MWT-MA-BIOM 2
PF MAP-S-BMP 2
WPF MT-MA-GPP 1-2
WPF NT-MA-BIOM 2
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Boccaccini, A.R.
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VORL; Online; 2 SWS; ECTS: 3; Mi, 8:15 - 9:45, (außer Mi 11.5.2022, Mi 15.6.2022, Mi 29.6.2022); Einzeltermine am 5.5.2022, 9.6.2022, 7.7.2022, 14.7.2022, 8:15 - 9:45; ab 4.5.2022; offered online via Microsoft Teams; for details please register on StudOn
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PF MAP-S-BMP 2
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Freitag, R.
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Modellbildung in der Partikeltechnik / Numerical Methods in Particle Technology [NMPT]
VORL; Präsenz; 2 SWS; ECTS: 4,5; Di, 8:15 - 9:45, 0.154-115; Link to the StudOn page: - https://www.studon.fau.de/crs4409920.html
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WPF CBI-MA 1-3
PF MAP-S-CMP 2
WPF CEN-MA 1-3
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Peukert, W.
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Nanotechnology of Disperse Systems [Nano]
VORL; Präsenz; 2 SWS; ECTS: 5; The first session will take place on 27 April as a face to face event. Visit the following StudOn page for more information: https://www.studon.fau.de/crs4410018.html; Mi, 14:15 - 15:45, 1.84; Link to the StudOn page: https://www.studon.fau.de/crs4410018.html
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WPF CBI-MA 1-3
PF MAP-S-NM 2
WPF ET-MA-VTE ab 1
WF LSE-MA 1-3
WPF CEN-MA 1-3
PF NT-MA 3
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Klupp Taylor, R.N.
Distaso, M.
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Numerische Methoden in den Werkstoffwissenschaften - Atomistische Methoden [NumWW]
V/UE; Online; 4 SWS; ECTS: 3; Einzeltermine am 3.6.2022, 13:15 - 14:45, 1.84; 3.6.2022, 15:00 - 18:00, 0.157-115; 24.6.2022, 13:15 - 14:45, 1.84; 24.6.2022, 15:00 - 18:00, 0.157-115; 22.7.2022, 15:00 - 18:00, 0.157-115; 22.7.2022, 13:15 - 14:45, 1.84; Vorbesprechung 06.05. 13:15-14:00 Uhr per zoom; For more information see studon: https://www.studon.fau.de/crs2202381.html
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WPF MWT-MA-AWE ab 1
PF MWT-MA-WSI 2
WPF MWT-MA-MNF ab 1
PF MAP-S-CMP 2
WF CE-MA-TA-CMS 2
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Bitzek, E.
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Process Technologies [PT]
VORL; 2 SWS; Schein; ECTS: 5,0; Mo, 10:15 - 11:45, 0.031-113
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WPF CBI-MA 1-3
PF MAP-S-AP 2
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Hartmann, M.
Kaspereit, M.
Freitag, D.
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Process Technologies Exercises
UE; 1 SWS; Schein; Mo, 08:15 - 09:45, 0.031-113
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WPF CBI-MA 1-3
PF MAP-S-AP 2
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Hartmann, M.
Freitag, D.
Kaspereit, M.
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Selbstorganisation an Oberflächen [MoleSAssy]
VORL; 2 SWS; ECTS: 3; Gaststudierende; Mi, 18:15 - 19:45, 1.84
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WPF MAP-S-NM 2
WPF WW-DH-LSP 8
WF WW-DH 8
WPF MWT-MA-LSP 2
PF NT-MA 2
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Halik, M.
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VORL; Präsenz; 1 SWS; ECTS: 1,5; Gaststudierende; Mi, 12:15 - 13:45, 0.151-115; details available on StudOn, please register: https://www.studon.fau.de/crs3784892.html
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PF MAP-S-AP 2
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Franken, T.
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Übung zu Modellbildung in der Partikeltechnik [NMPT-Ü]
UE; Präsenz; 1 SWS; Gaststudierende; the first lecture will be on Tuesday 26th April 8:15 am; Fr, 8:15 - 9:45, 0.157-115, KS I; https://www.studon.fau.de/crs4409920.html
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WPF CEN-MA 1-3
WPF CBI-MA 1-3
PF MAP-S-CMP 2
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Schikarski, T.
Traoré, N.
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Übung zu Nanotechnology of Disperse Systems [Nano-Ü]
UE; Präsenz; 1 SWS; Gaststudierende; Mi, 16:15 - 17:45, 1.84; https://www.studon.fau.de/crs4410018.html
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WPF ET-MA-VTE ab 1
WPF CEN-MA 1-3
WPF CBI-MA 1-3
WF LSE-MA 1-3
PF NT-MA 3
PF MAP-S-NM 2
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Klupp Taylor, R.N.
Distaso, M.
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