| Forschungsschwerpunkte The Institute of General Materials Properties is specialized in research related to micro-structure-based aspects of materials properties with particular emphasis on mechanical behaviour under complex loading conditions and on high-temperature solid-state reactions. The major areas of research are devoted to
Crystal Plasticity and Hardening Mechanisms High-Temperature Deformation Fatigue of Materials Internal and Residual Stresses Modelling (analytical, numerical, finite elements) Protective Coatings Materials Problems in Components Failure Analysis
Forschungsrelevante apparative AusstattungMetallography, Microscopy and Analysis:
2 Transmission electron microscopes (Philips EM 400T and Philips CM 200) with STEM and EDS, Tietz high-resolution CCD-camera on Philips CM 200 Scanning electron microscope, Jeol 6400 JSM with BSE, EBSP and EDS Optical microscope Leica DM-RM with digital camera ProgRes 3008 and image analy-sis system Image C Other different optical microscopes 2 X-ray diffractometers X-ray Laue camera X-ray topography apparatus Secondary ion mass spectrometer Scanning Auger microscope Perkin Elmer PHI 670 Xi with XPS (share, charge for use) Metallography and photographic laboratory 2 Ion mills Balzers RES 010
Mechanical testing:
2 Servohydraulic mechanical testing systems with high temperature equipment Servohydraulic mechanical testing system with heating/cooling/vacuum chamber Vibrophore system with vacuum chamber 3 Electromechanical mechanical testing systems with high temperature equipment 4 Compressive creep machines for tests at constant stress 4 Tensile creep machines for tests at constant stress 8 Tensile creep machines for tests at constant load
Others:
Elastomat for measurement of dynamic elastic constants 2 Dilatometers UNIX and PC-network, Windows Mechanical Workshop Central mechanical and electronic workshop (share, charge for material costs)
VeröffentlichungsreihenDie Veröffentlichungen des Jahres 2000 finden Sie als pdf-File unter:
http://131.188.233.11/scripte/veroeff00.pdf
Die Veröffentlichungen des Jahres 2001 finden Sie als pdf-File unter:
http://131.188.233.11/scripte/veroeff01.pdf Die Veröffentlichungen der letzten Jahre unter:
http://131.188.233.11/literatur.html#2000
| Leitung
Prof. Dr. rer. nat. Mathias Göken
PD Dr.-Ing. Heinz Werner Höppel
Professoren
Prof. Dr.-Ing. Erik Bitzek
Prof. Dr. Peter Felfer
Prof. Dr. rer. nat. Mathias Göken
Professoren i.R.
Prof. Dr.-Ing. Wolfgang Blum
Prof. Dr. Dr.-Ing. E.h. Hael Mughrabi
Akad. Räte
PD Dr.-Ing. Heinz Werner Höppel
Dr.-Ing. Duancheng Ma
Dr.-Ing. Steffen Neumeier
Wiss. Assistenten
Dr. Valentin Dalbauer
Dr.-Ing. Dorothea Matschkal
PD Dr.-Ing. Benoit Merle
Wiss. Mitarbeiter
Achraf Atila, M. Sc.
Andreas Bezold
Benedikt Diepold, M. Sc.
Benedikt Eggle-Sievers, M.Sc.
Daniel Elitzer, M. Sc.
Andreas Förner, M. Sc.
Stefan Gabel, M.Sc.
Philip Goik, M. Sc.
Daniel Hausmann
Lukas Haussmann, M. Sc.
Martina Heller
Frédéric Houllé
Fabian Hummel, M. Sc.
Jan Josten, M. Sc.
Dr. Shivraj Karewar
Saba Khadivianazar
Andreas Kirchmayer, M. Sc.
Manuel Köbrich, M. Sc.
Marius Kohlhepp, M. Sc.
Anna Krapf
Sebastian Krauß, M. Sc.
Moritz Kuglstatter, M. Sc.
PhD Chandra Macauley
Benedict Ott, M. Sc.
Nina Pfeffer, M. Sc.
Philip Pohl, M. Sc.
Lakshmipathy Tarakeshwar
Yvonne Thompson, M. Sc.
Nicklas Volz, M. Sc.
Stipendiaten
Maher Ghanem, M. Sc.
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